Aehr Receives Over $4 Million in Orders for its FOX WaferPak™ Full Wafer Contactors to Support Production Test and Burn-in of Silicon Carbide Power Semiconductors for Electric Vehicles
04 November 2022 - 10:30PM
Aehr Test Systems (NASDAQ: AEHR), a worldwide
supplier of semiconductor test and reliability qualification
equipment, today announced it has received $4.4 million in orders
from its lead silicon carbide test and burn-in customer for
multiple WaferPak™ full wafer Contactors to meet their increased
production capacity needs for silicon carbide power semiconductors
for the electric vehicle market. These WaferPak Contactors are
expected to ship by the end of Aehr’s fiscal third quarter ending
February 28, 2023.
Gayn Erickson, President and CEO of Aehr Test Systems,
commented, “We are excited to receive these follow-on orders for a
significant number of WaferPaks to be used with previously shipped
FOX-XP systems for high volume production of MOSFETS used in
electric vehicle inverters and onboard chargers. This customer is a
leading Fortune 500 supplier of semiconductor devices with a
significant customer base in the automotive semiconductor market,
and has publicly announced that they expect their growth rate to
accelerate faster than previously forecasted. We are excited to
participate in their ramp and meet their quality, reliability and
capacity needs, and they continue to forecast orders for a
significant number of FOX systems and WaferPak Contactors during
this fiscal year and well into the future.
“Customers may initially purchase a small number of WaferPaks to
be used in the characterization and qualification of devices with
their customers, and then upon successful qualification and design
wins, follow with orders like this for a significant number of
WaferPaks to be used with the FOX-XP multi-wafer systems they have
installed as they move into volume production.
“We continue to be very optimistic about our business. The
FOX-XP system is critical for wafer level burn-in of silicon
carbide devices to meet the quality and reliability needs of the
automotive industry, and from our conversations with most all of
the potential silicon carbide customers worldwide, it is very clear
that there is a plan to move to wafer level burn-in for their
devices. This is particularly true for the automotive space, where
traction inverters are shifting to multi-chip modules that provide
higher performance in terms of efficiency, cooling and system
integration.”
The FOX-XP system, available with multiple WaferPak Contactors
(full wafer test) or multiple DiePakTM Carriers (singulated
die/module test) configurations, is capable of functional test and
burn-in/cycling of integrated devices such as silicon carbide power
devices, silicon photonics as well as other optical devices, 2D and
3D sensors, flash memories, Gallium Nitride (GaN), magnetic
sensors, microcontrollers, and other leading-edge ICs in either
wafer form factor, before they are assembled into single or
multi-die stacked packages, or in singulated die or module form
factor.
About Aehr Test SystemsHeadquartered in
Fremont, California, Aehr Test Systems is a worldwide provider of
test systems for burning-in and testing logic, optical and memory
integrated circuits and has installed over 2,500 systems worldwide.
Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test
requirements, incremental capacity needs, and new opportunities for
Aehr Test products in package, wafer level, and singulated
die/module level test. Aehr Test has developed and introduced
several innovative products, including the ABTSTM and FOX-PTM
families of test and burn-in systems and FOX WaferPakTM Aligner,
FOX-XP WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak
Loader. The ABTS system is used in production and qualification
testing of packaged parts for both lower power and higher power
logic devices as well as all common types of memory devices. The
FOX-XP and FOX-NP systems are full wafer contact and singulated
die/module test and burn-in systems used for burn-in and functional
test of complex devices, such as leading-edge silicon carbide-based
power semiconductors, memories, digital signal processors,
microprocessors, microcontrollers, systems-on-a-chip, and
integrated optical devices. The FOX-CP system is a new low-cost
single-wafer compact test and reliability verification solution for
logic, memory and photonic devices and the newest addition to the
FOX-P product family. The WaferPak contactor contains a unique full
wafer probe card capable of testing wafers up to 300mm that enables
IC manufacturers to perform test and burn-in of full wafers on Aehr
Test FOX systems. The DiePak Carrier is a reusable, temporary
package that enables IC manufacturers to perform cost-effective
final test and burn-in of both bare die and modules. For more
information, please visit Aehr Test Systems’ website at
www.aehr.com. Safe Harbor StatementThis press
release contains certain forward-looking statements within the
meaning of Section 27A of the Securities Act of 1933 and Section
21E of the Securities Exchange Act of 1934. Forward-looking
statements generally relate to future events or Aehr’s future
financial or operating performance. In some cases, you can identify
forward-looking statements because they contain words such as
"may," "will," "should," "expects," "plans," "anticipates,” “going
to,” "could," "intends," "target," "projects," "contemplates,"
"believes," "estimates," "predicts," "potential," or "continue," or
the negative of these words or other similar terms or expressions
that concern Aehr’s expectations, strategy, priorities, plans, or
intentions. Forward-looking statements in this press release
include, but are not limited to, future requirements and orders of
Aehr’s new and existing customers; bookings forecasted for
proprietary WaferPakTM and DiePak consumables; and expectations
related to long-term demand for Aehr’s productions and the
attractiveness of key markets. The forward-looking statements
contained in this press release are also subject to other risks and
uncertainties, including those more fully described in Aehr’s
recent Form 10-K, 10-Q and other reports filed from time to time
with the Securities and Exchange Commission. Aehr disclaims any
obligation to update information contained in any forward-looking
statement to reflect events or circumstances occurring after the
date of this press release.
Contacts:
Aehr
Test Systems |
MKR
Investor Relations Inc. |
Vernon Rogers |
Todd Kehrli or Jim Byers |
EVP of Sales & Marketing |
Analyst/Investor Contact |
(510) 623-9400 x215 |
(323) 468-2300 |
vrogers@aehr.com |
aehr@mkr-group.com |
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