Free Keithley Web-Based Seminar Exposes the Secrets to Ensuring Accurate I-V Measurements
09 September 2010 - 11:00PM
Business Wire
Keithley Instruments, Inc. (NYSE: KEI), a world leader in
advanced electrical test instruments and systems, will broadcast a
free, web-based seminar titled “Tips, Tricks, and Traps in
Ultra-Fast I-V Semiconductor Characterization” on Thursday,
September 16, 2010. This one-hour presentation is designed to help
laboratory engineers implement, troubleshoot, and verify pulsed
I-V, transient I-V, and general Ultra-Fast I-V measurement systems
and will provide the keys to getting good I-V measurements. To
register for this event, visit
www.keithley.com/events/semconfs/webseminars.
Tips, Tricks, and Traps in Ultra-Fast I-V Semiconductor
Characterization is a follow-up to the material presented in
Keithley’s Fundamentals of Ultra-Fast I-V on-line seminar. Topics
to be discussed include system setup, typical measurement
limitations, and results from some actual devices. Those who attend
the seminar will learn:
- How to properly connect an
Ultra-Fast I-V instrument to a probe station
- Common problems encountered when
not properly cabled
- Tips on performance verification
at the probe tips
- Limitations in Ultra-Fast I-V,
including Johnson Noise and others
- Typical examples of Ultra-Fast
I-V on sample devices
The on-line event also features an interactive question and
answer session.
Tips, Tricks, and Traps in Ultra-Fast I-V Semiconductor
Characterization is intended for those whose job requires
performing all types of characterization measurements. Students,
technicians, engineers, and lab managers who are responsible for
installing and maintaining characterization equipment and probe
stations will also benefit from this seminar.
Lee Stauffer, a senior staff technologist for Keithley
Instruments’ Semiconductor Measurements Group in Cleveland, Ohio,
will present the seminar. Prior to joining Keithley, Stauffer’s
career included designing satellite communication systems, as well
as equipment and product engineering in semiconductor fabs.
Registration Information.Tips, Tricks, and Traps in
Ultra-Fast I-V Semiconductor Characterization will be broadcast on
Thursday, September 16, 2010 at 15:00 CEST (9:00 a.m. EDT) for the
European audience and at 2:00 p.m. EDT for the North American
audience. The event is free to the public, but participants must
register in advance at
www.keithley.com/events/semconfs/webseminars. The seminar will also
be archived on Keithley’s website for those unable to attend the
original broadcast.
For More Information.For more information on Keithley or
any of its test solutions, visit www.keithley.com or contact the
company at:
Telephone:
800-688-9951 440-248-0400 FAX: 440-248-6168 E-mail:
publisher@keithley.com
Internet:
www.keithley.com
Address: Keithley Instruments, Inc. 28775 Aurora Road Cleveland, OH
44139-1891
About Keithley Instruments, Inc.With more than 60 years
of measurement expertise, Keithley Instruments has become a world
leader in advanced electrical test instruments and systems. Our
customers are scientists and engineers in the worldwide electronics
industry involved with advanced materials research, semiconductor
device development and fabrication, and the production of end
products such as portable wireless devices. The value we provide
them is a combination of products for their critical measurement
needs and a rich understanding of their applications to improve the
quality of their products and reduce their cost of test.
Products and company names listed are
trademarks or trade names of their respective companies.
Keithley (NYSE:KEI)
Historical Stock Chart
From Nov 2024 to Dec 2024
Keithley (NYSE:KEI)
Historical Stock Chart
From Dec 2023 to Dec 2024