Bruker Announces Breakthrough in Analytical Performance with World's First Handheld XRF with Silicon Drift Detector (SDD)Bruker'
26 June 2008 - 6:10AM
Business Wire
Bruker AXS today announced a technology breakthrough with the
introduction of the new TRACERturboSD (TM), the world�s first
handheld X-ray Fluorescence (XRF) instrument that uses a Silicon
Drift Detector (SDD) for dramatically improved speed, sensitivity
and resolution. Bruker's industry-leading proprietary XFlash� SDD,
previously available only in high-performance laboratory XRF
instruments, now offers unprecedented speed and analytical
specificity when integrated into the novel handheld TRACERturboSD.
With this announcement, the Bruker AXS Handheld business,
previously known as Keymaster Technologies Inc., builds on its long
tradition of technology leadership in the handheld XRF industry
that includes: 2001 - First tube-based handheld XRF 2004 - First
vacuum handheld XRF, co-invented with NASA 2008 � First SDD-based
handheld XRF The revolutionary TRACERturboSD with integrated SDD
offers unparalleled speed, sensitivity and energy resolution,
previously found only in more expensive laboratory systems. Now all
handheld XRF customer segments can benefit from these compelling
performance advantages in their analytical work. For example, in
art conservation and archaeology analysis the much better SDD
energy resolution offers a significant gain in specificity and
information content. In the aerospace industry, the proprietary
Bruker SDD technology enables TRACERturboSD users to better and
faster analyze sophisticated light element alloys, even without the
use of a vacuum or helium attachment. Finally, in the general
metals analysis markets the TRACERturboSD offers higher speed,
sensitivity and selectivity for many demanding handheld XRF
applications. In addition to the new high-end TRACERturboSD, Bruker
AXS continues to offer the standard S1 Tracer� handheld instrument
with traditional SiPIN diode technology for routine analysis.
Moreover, the well-known joint Bruker-NASA vacuum technology can be
combined with the SDD for the ultimate in light-element sensitivity
in a handheld XRF instrument. Frank Laukien, President and CEO of
Bruker Corporation, said: "We are very proud to announce this
cutting-edge next-generation handheld XRF, incorporating our
proprietary XFlash SDD technology. We believe the TRACERturboSD
will have enormous analytical benefits for handheld XRF users, and
it truly represents a disruptive technology in this field." John
Landefeld, Vice President of Bruker AXS Handheld, indicated: "This
breakthrough continues our tradition of technology leadership,
going back to the initial introduction of tube-based XRF handhelds
in 2001. Following the joint NASA-Bruker development of vacuum
technology for handhelds in 2004, Bruker proves, once again, to be
the technology leader in handheld XRF instrumentation." "The
aerospace industry and the art & conservation communities will
be particularly pleased to find that high-end handheld XRF can now
approach the capabilities of laboratory systems,� added John
Patterson, Director of Marketing and Product Management of Bruker
AXS Handheld. The TRACERturboSD is being introduced to the
aerospace industry at the Aeromat Conference & Exposition
taking place June 23-26 in Austin, Texas. Bruker will also exhibit
the new handheld SDD instrument at the Denver X-ray Conference on
August 4-8 in Denver, Colorado. For more TRACERturboSD information,
visit: www.bruker-axs.com/handheld ABOUT BRUKER AXS For more
information about Bruker AXS and Bruker Corporation (NASDAQ: BRKR),
please visit www.bruker-axs.com and www.bruker.com.
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