Bruker Introduces Two New Analytical Accessories for Electron Microscopes
05 August 2013 - 11:26PM
Business Wire
At the Microscopy & Microanalysis 2013 Meeting
(www.microscopy.org/MandM/2013), Bruker today introduces two new
instruments which further expand its portfolio of high-performance
tools for materials characterization in electron microscopes:
XSense WDS analyzer (Photo: Business
Wire)
- XSense™ is a novel parallel beam
wavelength dispersive X-ray spectrometer (WDS) for elemental
analysis on scanning electron microscopes (SEM). Specifically
designed for the lower energy range between 100 and 3,600 eV, the
XSense spectrometer provides energy resolution down to 4 eV,
enabling both excellent separation of closely spaced X-ray lines
and highly sensitive trace element detection.
- XTrace™ is a new micro-spot
X-ray source that enables photon-induced micro X-ray fluorescence
(micro-XRF) spectrometry on SEM systems, in conjunction with
Bruker’s energy dispersive X-ray spectrometer (EDS) detectors. In
comparison with electron-excited X-ray spectrometry commonly used
for elemental analysis on SEMs, micro-XRF spectrometry provides 20
to 50 times lower limits of detection, in particular in the
mid-to-high energy range of the spectrum, adding the capability of
detecting and analyzing trace amounts of higher-Z elements in the
sample.
The new XSense WDS analyzer uses special X-ray mirror
optics for efficient large angle X-ray collection and
parallelization. A fully motorized 3-axis auto-alignment system
ensures fast, reproducible and stable positioning of the focal
spot. The parallel beam optics is fully retractable, and made of
non-magnetic materials to avoid beam shift and image distortion.
With a choice of six diffracting crystals, XSense can be
tuned to provide optimum conditions for almost any application. Its
advanced kinematics maintains optimum positioning of the active
crystal with respect to the X-ray beam over the full scan range for
maximum diffraction efficiency. An additional, secondary X-ray
optics between crystal and detector further enhances
peak-to-background ratios and sensitivity of the XSense WDS.
Bruker’s unique detector management system actively controls the
proportional counter’s internal gas pressure and automatically
performs all high voltage and discriminator settings.
When attached to an appropriate port of the SEM’s sample
chamber, the new XTrace is using a low-power micro-focus
X-ray tube and focusing polycapillary X-ray optics to produce a
highly intense X-ray beam for sample irradiation with spot sizes
smaller than 40 microns. Due to the alignment of the focal spot to
hit the sample surface at the same position as the SEM’s electron
beam, the analyst can alternatively acquire both electron-induced
and photon-induced X-ray fluorescence spectra from the same sample
area.
While electron-induced X-ray spectroscopy provides high spatial
resolution and excellent light element detection, photon excitation
with XTrace is superior in sensitivity and allows trace
element detection down to 10 ppm levels. Combining the information
obtained with the two techniques can greatly enhance the accuracy
of the analytical results.
Both the XSense WDS analyzer and the XTrace micro
X-ay source are operated via ESPRIT 2.0, Bruker’s new and unique
4-in-1 analytical software suite which seamlessly integrates EDS,
WDS, EBSD and Micro-XRF under a single user interface. ESPRIT 2.0
not only enables intuitive navigation within and between all four
complementary methods, but also provides various possibilities for
combining the data to obtain higher precision quantitative
results.
Thomas Schülein, President of the Bruker Nano Analytics
division, stated: “With the introduction of these exciting new
products we are now offering our customers unprecedented options to
significantly enhance the analytical power of their electron
microscope. As integral parts of our QUANTAX system for micro- and
nano-analysis, both new tools are designed to improve specificity
and sensitivity of the analytical SEM over the full range of the
energy spectrum. The XSense WDS is dedicated to the low
energy, light element region, and the XTrace is particularly
suited to reveal additional analytical information in the
mid-to-high energy range. We are proud that Bruker is now the only
vendor to offer all five techniques, EDS, WDS, EBSD, Micro-XRF and
Micro-CT, as high-performance add-on analyzers for electron
microscopes. Due to the full integration under our new ESPRIT 2.0
software suite, researchers can now combine and integrate data
obtained by these complementary methods. As a result, our QUANTAX
system has now evolved into a true multimodal analytical toolset
for comprehensive materials characterization on electron
microscopes."
For more information on XSense and XTrace, please visit:
www.bruker.com/XSense and www.bruker.com/XTrace.
About Bruker Corporation
Bruker Corporation (NASDAQ: BRKR) is a leading provider of high
performance scientific instruments and solutions for molecular and
materials research, as well as industrial, diagnostics and applied
analysis.
For more information, please visit www.bruker.com.
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Bruker Nano Analytics DivisionStefan Langner, +49 (30)
670990-802Marketing Communications
Managerstefan.langner@bruker-nano.de
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