Cascade Microtech Named Finalist of 2013 EE Times and EDN ACE Award for Ultimate Products -- Test & Measurement Systems and B...
29 March 2013 - 2:00AM
Marketwired
Cascade Microtech, Inc. (NASDAQ: CSCD), a leader at enabling
precision measurements of integrated circuits at the wafer level,
today announced it has been named a finalist in UBM Tech's EE Times
and EDN Annual Creativity in Electronics (ACE) Awards for Ultimate
Products -- Test & Measurement Systems and Boards. The
company's APS200TESLA fully-automated system for on-wafer power
device probing was among the top five products to be named in this
category.
New and emerging applications in renewable energy and industrial
power will challenge power device manufacturers to design and
manufacture more efficient devices at a lower cost, driving the
need for test solutions specifically targeted for
high-voltage/high-current probing. Rated up to 10.5k V/400 A,
Cascade Microtech's APS200TESLA is the first fully-automated
on-wafer probe system to offer unmatched electrical performance for
HI/HV probing of power devices in a production environment. The
probe system comes with a high-voltage/high-current probe card, a
high-voltage/high-power chuck port, and the patent-pending
MicroVac™ high-power chuck that can handle wafer thicknesses down
to 50 µm, such as the ultra-thin Taiko wafers. An optimized
electrical connection easily integrates the APS200TESLA with a
variety of test instruments, and the interlock-enabled safety
shield provides a regulatory-approved safe environment for the
operator. The arc-suppression feature allows the customer to
optimize device layout to achieve better yields and deliver
superior cost of test. Auto-discharging and the unique probe-pin
touch sensing capability prevent device damage due to high-voltage
discharge during die-to-die moves. The APS200TESLA also offers
advanced prober control software for automatic wafer and die
stepping.
"The new APS200TESLA leverages our experience in achieving
accurate on-wafer measurement to provide an advanced power device
measurement system that helps our customers increase test
throughput," said Debbora Ahlgren, Vice President, Marketing,
Cascade Microtech, Inc. "By enabling on-wafer production test, the
APS200TESLA permits our customers to reduce their cost of test and
ensures the safety of both devices and operators."
The Annual Creativity in Electronics (ACE) Awards celebrate the
creators of technology who demonstrate leadership and innovation in
the global industry and shape the world we live in. Winners will be
announced at the EE Times and EDN ACE Awards ceremony on April 23,
2013, as part of UBM Tech's DESIGN West and ESC Silicon Valley
Conference.
About Cascade Microtech, Inc. Cascade
Microtech, Inc. (NASDAQ: CSCD) is a worldwide leader in precision
contact, electrical measurement and test of integrated circuits
(ICs), optical devices and other small structures. For technology
businesses and scientific institutions that need to evaluate small
structures, Cascade Microtech delivers access to electrical data
from wafers, ICs, IC packages, circuit boards and modules, MEMS, 3D
TSV, LED devices and more. Cascade Microtech's leading-edge
stations, probes, probe cards and integrated systems deliver
precision accuracy and superior performance both in the lab and
during production manufacturing of high-speed and high-density
semiconductor chips. For more information visit
www.cascademicrotech.com.
FOR MORE INFORMATION, CONTACT: Debbora Ahlgren Cascade
Microtech, Inc. (503) 601-1829 Debbora.Ahlgren@cmicro.com
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