Aehr Test Systems Receives Follow-on Orders Exceeding $1.3 Million for FOX-1™ WaferPak™ Contactors
09 August 2017 - 9:00PM
Aehr Test Systems (NASDAQ:AEHR), a worldwide
supplier of semiconductor test and burn-in equipment, today
announced it has received follow-on orders exceeding $1.3 million
for multiple WaferPak contactors for its FOX-1 wafer level test
system.
Gayn Erickson, President and CEO of Aehr Test Systems,
commented, “We are pleased to receive follow-on orders from this
customer reflecting additional capacity needs. It’s gratifying to
see renewed demand for our proprietary WaferPak contactors from our
installed base of FOX-1 systems, as we have seen a lull in
purchasing WaferPaks for these older systems. We have been seeing
utilization rates increase on our FOX-1 single wafer and FOX-15™
multi-wafer systems, which now join the high utilization rates we
have previously reported on our package level test and burn-in
system installed base. As our FOX system installed base increases,
we expect that our WaferPak full wafer contactors and DiePak®
carriers will continue to grow as a percentage of our total sales,
particularly with our new FOX-XP™ multi wafer and singulated
die/module test and burn-in system.”
The FOX-1 test system is a member of Aehr Test's first
generation of volume production full wafer test and burn-in systems
and was the first system to be able to test an entire wafer of
flash memory or micro-controller devices in parallel using Built-in
Self-Test (BIST) techniques. A cost-effective solution for
single touchdown full wafer testing, the FOX-1 system is capable of
delivering over 12,000 individual device power supplies and tests
thousands of devices on a single wafer. It is capable of testing up
to 6,000 NOR or NAND flash memories on a 300mm wafer in a single
contact using Aehr Test’s integration of BIST and low pin count
test methodologies. Aehr Test’s WaferPak contactors can be
configured with up to 50,000 contacts or more, resulting in a very
low cost of test/ownership.
Aehr Test began volume deliveries of its next generation FOX-1P™
single wafer test system last year. The FOX-1P system is capable of
providing up to 16,000 Universal Channel resources (software
selectable I/Os, Clocks, Device Power Supplies, or Per-pin
Precision Measurement Units) to a single wafer. Both the FOX-1 and
FOX-1P systems have the highest number of tester resources per
wafer of any product in the market.
Aehr Test’s proprietary WaferPak contactors are available for
the FOX-1, FOX-15, and the new FOX-XP multi-wafer test and burn in
systems, and are consumables that are uniquely designed to the
customers’ devices.
About Aehr Test
SystemsHeadquartered in Fremont, California, Aehr Test
Systems is a worldwide provider of test systems for burning-in and
testing logic, optical and memory integrated circuits and has an
installed base of more than 2,500 systems worldwide. Increased
quality and reliability needs of the Automotive and Mobility
integrated circuit markets are driving additional test
requirements, incremental capacity needs, and new opportunities for
Aehr Test products in package, wafer level, and singulated
die/module level test. Aehr Test has developed and introduced
several innovative products, including the ABTS and
FOX-P™ families of test and burn-in systems and FOX
WaferPak™ Aligner, FOX-XP WaferPak Contactor, and FOX DiePak®
Carrier. The ABTS system is used in production and
qualification testing of packaged parts for lower power and higher
power logic devices as well as all common types of memory devices.
The FOX-XP system is a full wafer contact and singulated die/module
test and burn-in system used for burn-in and functional test of
complex devices, such as leading-edge memories, digital signal
processors, microprocessors, microcontrollers, systems-on-a-chip,
and integrated optical devices. The WaferPak Contactor
contains a unique full wafer probe card capable of testing wafers
up to 300mm that enables IC manufacturers to perform test and
burn-in of full wafers on Aehr Test FOX systems. The DiePak
Carrier is a reusable, temporary package that enables IC
manufacturers to perform cost-effective final test and burn-in of
both bare die and modules. For more information, please visit Aehr
Test System’s website at www.aehr.com.
Safe Harbor StatementThis press
release contains certain forward-looking statements based on
current expectations, forecasts and assumptions that involve
risks and uncertainties. These statements are based
on information available to Aehr Test as of the date hereof
and actual results could differ materially from those stated
or implied due to risks and uncertainties. Forward-looking
statements include statements regarding Aehr Test's
expectations, beliefs, intentions or strategies regarding
the FOX products, including statements regarding future market
opportunities and conditions, expected product shipment dates
and customer orders or commitments. These risks
and uncertainties include, without limitation, acceptance by
customers of the FOX and WaferPak contactor technologies,
acceptance by customers of the FOX-XP system, WaferPak Aligner and
WaferPak contactors shipped upon receipt of a purchase order and
the ability of new products to meet customer needs or perform as
described, as well as general market conditions, customer demand
and acceptance of Aehr Test’s products and Aehr Test’s ability to
execute on its business strategy. See Aehr Test’s recent 10-K, 10-Q
and other reports from time to time filed with the Securities and
Exchange Commission for a more detailed description of the risks
facing Aehr Test’s business. Aehr Test disclaims any obligation to
update information contained in any forward-looking statement to
reflect events or circumstances occurring after the date of this
press release.
Contacts:
Aehr Test Systems
Carl Buck
V.P. of Marketing
(510) 623-9400 x381
cbuck@aehr.com
MKR Group Inc.
Todd Kehrli or Jim Byers
Analyst/Investor Contact
(323) 468-2300
aehr@mkr-group.com
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