Technology Leader Cascade Microtech Wins "Best in Test" Award for CM300 Probe System
09 April 2014 - 4:00AM
Marketwired
Technology Leader Cascade Microtech Wins "Best in Test" Award for
CM300 Probe System
BEAVERTON, OR--(Marketwired - Apr 8, 2014) - Cascade Microtech,
Inc. (NASDAQ: CSCD), a leading supplier of solutions that enable
precision measurements of integrated circuits at the wafer level,
today announced that its CM300 Probe System was voted "Best in
Test" in the category of Semiconductor Test. The "Best in Test"
awards are presented annually by EDN, part of UBM Tech's portfolio
of communities for the electronics industry, to honor important and
innovative new products and services in the electronics test and
measurement industry.
Semiconductor manufacturers are facing demanding challenges in
device design and test productivity, and are constantly under
pressure to reduce test costs. Cascade Microtech is moving the
industry forward with innovative solutions like the CM300 probe
system which, when paired with advanced Pyramid Probe® technology,
recently broke through the 25 um-diameter micro-bump barrier. The
CM300's highly configurable and scalable platform provides upgrade
paths for measurement capability, application flexibility and test
automation. The CM300 automates on-wafer device measurements and
enhances device and process characterization and modeling by
capturing the true electrical performance of devices, enabling
hands-off productivity.
Since its introduction in January of 2013, the CM300 has been
selected for use in the engineering labs of major foundries,
integrated device manufacturers and leading fabless companies. The
product's flexibility and scalability are contributing to its early
success in the market.
The CM300 probe system allows a high degree of measurement
complexity and test flexibility to perform I-V, C-V and RF
measurements over a broad temperature range. Future innovations,
such as support for 1/f measurements, planned for the product will
extend its capabilities. With fast and well-characterized thermal
transition and probe-to-pad alignment, the CM300 processes a high
volume of measurement data with accuracy on pads as small as 30 µm.
The CM300's measurement automation, including the ability to reduce
idle time while testing over a wide span of temperatures, improves
throughput while delivering high volumes of reliable data. With
Velox™ software, the CM300 enables fast wafer loading and easy test
automation while preventing damage of probe tips, probe cards and
customer wafers throughout the entire measurement cycle.
"Cascade Microtech takes pride in its legacy of innovation
dating back 30 years," said Michael Burger, president and CEO of
Cascade Microtech, Inc. "We are thrilled to be honored for product
innovation in the Semiconductor Test category, and to be recognized
for our commitment to delivering leading-edge solutions that help
our customers address emerging test and measurement
challenges."
About Cascade Microtech, Inc. Cascade Microtech,
Inc. (NASDAQ: CSCD) is a worldwide leader in precision contact,
electrical measurement and test of integrated circuits (ICs),
optical devices and other small structures. For technology
businesses and scientific institutions that need to evaluate small
structures, Cascade Microtech delivers access to electrical data
from wafers, ICs, IC packages, circuit boards and modules, MEMS, 3D
TSV, LED devices and more. Cascade Microtech's leading-edge
stations, probes, probe cards, advanced thermal subsystems and
integrated systems deliver precision accuracy and superior
performance both in the lab and during production manufacturing of
high-speed and high-density semiconductor chips. For more
information visit www.cascademicrotech.com.
FOR MORE INFORMATION, CONTACT: Debbora Ahlgren Cascade
Microtech, Inc. (503) 601-1829 Debbora.Ahlgren@cmicro.com
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