Aehr Test Systems Announces Order for ABTS-Pi™ Burn-in and Test System from new Semiconductor Manufacturing Customer in Chi...
06 November 2017 - 11:30PM
Aehr Test Systems (Nasdaq:AEHR), a worldwide
supplier of semiconductor test and burn-in equipment, today
announced that it has received an order for its Advanced Burn-in
and Test System (ABTS) from a new customer in China. This system is
expected to ship in Aehr Test’s fiscal 2018 fourth quarter.
Gayn Erickson, President and CEO of Aehr Test Systems, said,
“This initial order from a new customer in China represents our
10th customer in China and continues our expansion and success in
the growing China market. We believe that the customer
selected our ABTS-Pi solution for its quality, reliability and
outstanding performance. Aehr offers highly capable direct
local support to our customers in China, helping customers to get
the most from their ABTS systems. The system will be used for
reliability testing of this customer’s semiconductor devices,
including life tests. The ABTS-Pi model was selected because
the customer’s high-power devices require individual temperature
control per device, and the ABTS-Pi systems have a market-leading
capacity in this mode.”
According to the Semiconductor Industry Association (SIA), China
chip sales are expected to grow 25% YoY in 2017 and in 2018, China
is expected to overtake Taiwan to become the second largest
Semiconductor producer (Korea is first). SEMI projects
Semiconductor Manufacturing Equipment sales in China to grow 61% in
2018.
“China continues to accelerate its growth in semiconductor
manufacturing and increased production infrastructure and testing
capacity, and we see significant opportunities for continued
expansion in this growing market with our innovative burn-in and
test systems,” Erickson concluded.
Aehr Test’s ABTS family of products is based on a
state-of-the-art hardware and software platform that is designed to
address not only today’s devices, but also future devices for many
years to come. It can test and burn-in both logic and memory
devices and includes resources for high pin-count devices and
configurations for high-power and low-power applications. ABTS
systems can be configured with up to 72 burn-in boards, up to 320
I/O channels, 32M of test vector memory per channel and up to 16
independent device power supplies. The ABTS system can be
configured with a scalable cost-effective individual device
temperature control solution for up to 64 devices per burn-in board
and up to 75 watts per device or more. Individual temperature
control enables high-power devices with a broad range of power
dissipation to be burned-in simultaneously in a single burn-in
chamber while maintaining a precise device temperature. The ABTS
system also uses N+1 redundancy technology for many key components
in the system to maximize system uptime.
About Aehr Test
SystemsHeadquartered in Fremont, California, Aehr Test
Systems is a worldwide provider of test systems for burning-in and
testing logic, optical and memory integrated circuits and has an
installed base of more than 2,500 systems worldwide. Increased
quality and reliability needs of the Automotive and Mobility
integrated circuit markets are driving additional test
requirements, incremental capacity needs, and new opportunities for
Aehr Test products in package, wafer level, and singulated
die/module level test. Aehr Test has developed and introduced
several innovative products, including the ABTS and FOX-PTM
families of test and burn-in systems, the FOX WaferPakTM Aligner,
FOX-XP WaferPak Contactor, and FOX DiePak® Carrier. The ABTS
system is used in production and qualification testing of packaged
parts for lower power and higher power logic devices as well as all
common types of memory devices. The FOX-XPTM system is a full wafer
contact and singulated die/module test and burn-in system used for
burn-in and functional test of complex devices, such as
leading-edge memories, digital signal processors, microprocessors,
microcontrollers, systems-on-a-chip, and integrated optical
devices. The WaferPak Contactor contains a unique full wafer
probe card capable of testing wafers up to 300mm that enables IC
manufacturers to perform test and burn-in of full wafers on Aehr
Test FOX systems. The DiePak Carrier is a reusable, temporary
package that enables IC manufacturers to perform cost-effective
final test and burn-in of both bare die and modules. For more
information, please visit Aehr Test System’s website at
www.aehr.com.
Safe Harbor StatementThis press
release contains certain forward-looking statements based on
current expectations, forecasts and assumptions that involve risks
and uncertainties. These statements are based on information
available to Aehr Test as of the date hereof and actual results
could differ materially from those stated or implied due to risks
and uncertainties. Forward-looking statements include statements
regarding expected shipping dates of our ABTS systems and uses of
our ABTS systems. The risks and uncertainties that could cause our
results to differ materially from those expressed or implied by
such forward-looking statements include, without limitation,
general world economic conditions and events, the state of the
semiconductor equipment market, our ability to maintain sufficient
cash to support operations, acceptance by customers of the ABTS
technology, acceptance by customers of the ABTS systems shipped
upon receipt of a purchase order and the ability of new products to
meet customer needs or perform as described. See Aehr Test’s recent
10-K and other reports from time to time filed with the Securities
and Exchange Commission for a more detailed description of the
risks facing our business. Aehr Test disclaims any obligation to
update information contained in any forward-looking statement to
reflect events or circumstances occurring after the date of this
press release.
Contacts:Aehr Test
Systems Carl
Buck
V.P. of Marketing (510)
623-9400 x381 cbuck@aehr.com
MKR Group Inc.Todd Kehrli or Jim
ByersAnalyst/Investor Contact (323) 468-2300aehr@mkr-group.com
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