Bruker AXS Announces Closing of S.I.S. Acquisition and Exhibits its New Atomic Force Microscopy (AFM) Product Line at EMC 2008Th
01 September 2008 - 3:26PM
Business Wire
Bruker AXS GmbH announces the closing of its acquisition of S.I.S.
Surface Imaging Systems GmbH, located near Aachen, Germany. S.I.S.
develops, manufactures and distributes advanced atomic
force/scanning probe microscopy (AFM/SPM) systems for numerous
applications in materials research, including semiconductors, data
storage, electronic materials, solar cells, polymers and catalysts.
S.I.S. will be renamed Bruker Nano GmbH and will operate under its
previous management. Starting today, Bruker�s new AFM product line
will be exhibited at the 14th European Microscopy Congress (EMC
2008, September 1-5), also in Aachen, Germany. Dr. Frank Burgaezy,
Bruker AXS Executive Vice President, commented: �The new Bruker
high-performance AFM products range from small bench-top AFM
systems, to integrated high-end AFM/optical microscope
combinations, all the way to large floor standing instruments for
the characterization of 300mm wafers in clean room environments.
The impressive S.I.S. core technology consists of extremely compact
AFM/SPM components which can be used easily with many instruments
such as optical microscopes or micro-hardness testers. We are very
pleased to have S.I.S. join the Bruker group, and further enhance
our extensive high-performance materials research and QC product
lines.� �The most widely distributed S.I.S. product is the
ULTRAObjective�, an extremely compact AFM add-on unit which can be
easily integrated with standard optical microscopes. This
straightforward integration provides direct access to the
nanoworld, without compromise,� added S.I.S. Managing Director Dr.
Frank Saurenbach. The PICOStation� system is an AFM/SPM stand-alone
instrument achieving atomic resolution. With optional upgrades, the
functionality can be expanded to a full-fledged AFM/SPM research
tool. The options range from non-contact, MFM/EFM and force
spectroscopy modes to measurements of friction and adhesion
properties, all the way to resistance/work function
characterization. A liquid immersion system is also available.
Combined with the optics of a research-grade optical microscope,
the NANOStation� II is a high performance inspection system. This
robust instrument provides resolution in the sub-nanometer range
and accepts various sample sizes. The easy handling of both the
optical inspection and the AFM tool makes the NANOStation II a
workhorse in every lab where accuracy, stability and reliability
are of concern. With the NANOStation� HD, Bruker now provides an
AFM inspection tool that provides resolution in the sub-Angstrom
range and operates with under automation. Initially developed for
the routine characterization of defects on hard disks, the
NANOStation HD has evolved to a widely used premium AFM in various
industrial applications. It allows preselecting multiple scanning
locations with the integrated optical microscope, and subsequently
running fully automatic AFM measurements. With its
macro-programming capability, the user can even implement
measurement cycles and methods. The NANOStation HD can be equipped
with R-? or X-Y stages and handles sample sizes up to 100mm. The
NANOStation� 300 AFM/SPM tool is another highlight of the new
Bruker AFM product range. It combines the ability to inspect large
samples with sizes up to 300 mm with a premium resolution of better
than 0.05 nm. The rock-solid platform consists of granite with
integrated air-bearing stages for fast positioning and high
repeatability. Targeting the semiconductor market, the NANOStation
300 is clean room compatible and provides automated measurements.
Coordinate files of various formats can be imported and used for
finding and identifying defects. The NANOStation 300 is made for
wafer inspection, mask metrology, solar panel characterization, and
other applications where large samples need to be inspected with
highest accuracy. Besides AFM, the NANOStation 300 can be equipped
with optical, confocal, Laser scanning, Raman microscopy or other
inspection tools. ABOUT BRUKER AXS: For more information about
Bruker AXS and Bruker Corporation (NASDAQ: BRKR), please visit
www.bruker-axs.com and www.bruker.com.
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