Aehr Receives $19.4 Million Order for Multiple FOX-XP™ Test and Burn-in Systems from Major Automotive Semiconductor Supplier
07 September 2021 - 9:30PM
Aehr Test Systems (NASDAQ: AEHR), a worldwide
supplier of semiconductor test and reliability qualification
equipment, today announced it has received a $19.4 million order
from its lead silicon carbide test and burn-in customer for
multiple FOX-XP systems to meet their increased production capacity
needs.
This customer is a leading Fortune 500 supplier of semiconductor
devices with a significant customer base in the automotive
semiconductor market, and is using the FOX-XP systems for test and
burn-in of silicon carbide devices for electric vehicles. The
corresponding Aehr proprietary WaferPak™ Contactors for these
systems, which are used to make contact with every device on each
of 18 wafers in parallel per system, will be purchased
in follow-on orders from this customer. These
systems are scheduled to be delivered over the next nine
months.
Gayn Erickson, President and CEO of Aehr Test Systems,
commented, “We continue to work closely with this customer to
achieve their test requirements and are excited to receive this
order for multiple systems, which exceeds the total number of
systems this customer has purchased from us to date. These
additional systems are to meet capacity needs of silicon carbide
devices used for power conversion components in on-board and
off-board electric vehicle chargers as well as the inverters used
in electric vehicle motor controllers. This customer also expects
silicon carbide capacity in other major markets, including home
electric storage and solar power conversion, and we look forward to
meeting their demand over the next several years and into the
future.
“Aehr Test is currently ramping our FOX Wafer Level Test and
Burn-in Systems and WaferPak Contactors to meet the silicon carbide
market opportunity that we believe is only just beginning. Silicon
carbide power semiconductors have emerged as the preferred
technology for battery electric vehicle power conversion in
on-board and off-board electric vehicle battery chargers, and the
electric power conversion and control of the electric engines.
These devices reduce power loss by as much as > 75% over power
silicon alternatives like IGBT (Insulated-gate bipolar transistor)
devices, which has essentially changed the entire market dynamic.
The challenge with silicon carbide is that it is known to have high
infant mortality rates. However, with the reliability burn-in
and screening that Aehr is able to offer with our FOX product
solutions, these defects can be removed to provide extremely
reliable devices for these mission-critical applications.
“Aehr’s FOX-XP solution allows for one of the key reliability
screening tests to be completed on an entire wafer full of devices,
testing all of them at one time while also testing and monitoring
every device for failures during the burn-in process to provide
critical information on those devices. This is an enormously
valuable capability, as it allows our customers to screen devices
that would otherwise fail after they are packaged into multi-die
modules, where the yield impact is 10 times or even 100 times as
costly. Our FOX-P™ family of products are very cost-effective
solutions for ensuring the critical quality and reliability of
devices in this market, where performance and reliability can not
only mean increased battery life, but also whether you have to walk
home from a vehicle whose power semiconductor fails in the power
train.
“As we’ve noted before, Aehr’s proprietary test and burn-in
solutions include customized WaferPaks and DiePaks that are needed
not only for new systems orders, but also for each new device
design or new device added to production test. As we increase our
installed base of FOX systems with current and new customers,
particularly with our FOX-NPTM and FOX-XP multi-wafer and
singulated die/module test and burn-in systems, we expect our
consumables business will continue to grow in absolute value and as
a percentage of our total sales. Over the long term, we expect to
see a steady rate of more than 50 percent of our total annual
revenue coming from these consumables.”
“The power semiconductor market for electric vehicles is
expected to triple between 2020 and 2026, growing at a nearly 26%
CAGR to $5.6 billion, according to Yole research. And a report
from Deloitte forecasts total electric vehicle sales will grow
at a CAGR of 29% from 2020 to 2025, before reaching
31.1 million by 2030 and securing approximately 32% of the
total market share for new car sales. Market research firm
Exawatt (exa-watt.com) estimates that the total market for silicon
carbide wafers for power semiconductors for electric vehicles in
2021 will be 133,000 150mm equivalent wafers and the total market
will exceed 1.23 million 150 mm equivalent wafers in 2030. These
forecasts highlight the tremendous opportunity Aehr Test has in
front of it with its wafer level test and burn-in solution for
electric vehicle semiconductors.”
The FOX-XP system, available with multiple WaferPak Contactors
(full wafer test) or multiple DiePakTM Carriers (singulated
die/module test) configurations, is capable of functional test and
burn-in/cycling of integrated devices such as silicon carbide power
devices, silicon photonics as well as other optical devices, 2D and
3D sensors, flash memories, Gallium Nitride (GaN), magnetic
sensors, microcontrollers, and other leading-edge ICs in either
wafer form factor, before they are assembled into single or
multi-die stacked packages, or in singulated die or module form
factor.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a
worldwide provider of test systems for burning-in and testing
logic, optical and memory integrated circuits and has installed
over 2,500 systems worldwide. Increased quality and reliability
needs of the Automotive and Mobility integrated circuit markets are
driving additional test requirements, incremental capacity needs,
and new opportunities for Aehr Test products in package, wafer
level, and singulated die/module level test. Aehr Test has
developed and introduced several innovative products, including the
ABTSTM and FOX-PTM families of test and burn-in systems and FOX
WaferPakTM Aligner, FOX-XP WaferPak Contactor, FOX DiePak® Carrier
and FOX DiePak Loader. The ABTS system is used in production and
qualification testing of packaged parts for both lower power and
higher power logic devices as well as all common types of memory
devices. The FOX-XP and FOX-NP systems are full wafer contact and
singulated die/module test and burn-in systems used for burn-in and
functional test of complex devices, such as leading-edge memories,
digital signal processors, microprocessors, microcontrollers,
systems-on-a-chip, and integrated optical devices. The FOX-CP
system is a new low-cost single-wafer compact test and reliability
verification solution for logic, memory and photonic devices and
the newest addition to the FOX-P product family. The WaferPak
contactor contains a unique full wafer probe card capable of
testing wafers up to 300mm that enables IC manufacturers to perform
test and burn-in of full wafers on Aehr Test FOX systems. The
DiePak Carrier is a reusable, temporary package that enables IC
manufacturers to perform cost-effective final test and burn-in of
both bare die and modules. For more information, please visit Aehr
Test Systems’ website at www.aehr.com.
Safe Harbor StatementThis press release
contains certain forward-looking statements within the meaning of
Section 27A of the Securities Act of 1933 and Section 21E of the
Securities Exchange Act of 1934. Forward-looking statements
generally relate to future events or Aehr’s future financial or
operating performance. In some cases, you can identify
forward-looking statements because they contain words such as
"may," "will," "should," "expects," "plans," "anticipates,” “going
to,” "could," "intends," "target," "projects," "contemplates,"
"believes," "estimates," "predicts," "potential," or "continue," or
the negative of these words or other similar terms or expressions
that concern Aehr’s expectations, strategy, priorities, plans, or
intentions. Forward-looking statements in this press release
include, but are not limited to, future requirements and orders of
Aehr’s new and existing customers; bookings forecasted for
proprietary WaferPakTM and DiePak consumables; and expectations
related to long-term demand for Aehr’s productions and the
attractiveness of key markets. The forward-looking statements
contained in this press release are also subject to other risks and
uncertainties, including those more fully described in Aehr’s Form
10-K for fiscal 2021 and other reports filed from time to time with
the Securities and Exchange Commission. Aehr disclaims any
obligation to update information contained in any forward-looking
statement to reflect events or circumstances occurring after the
date of this press release.
Contacts: |
|
|
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Aehr Test Systems |
MKR Investor Relations Inc. |
Vernon Rogers |
Todd Kehrli or Jim Byers |
EVP of Sales & Marketing |
Analyst/Investor Contact |
(510) 623-9400 x215 |
(323) 468-2300 |
vrogers@aehr.com |
aehr@mkr-group.com |
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